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Research Center For Integrated Quantum Electronics, Hokkaido University
       
MBE Electronics Group
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Research Activity
Publication
Proceeding
Ed.,Writing
|1-30| |31-60| |61-86|
|1-30| |31-60| |61-90| |91-120| |121-137|
Proceeding 61-90
1999-2002
  1. S. Ootomo, S. Oyama, T. Hashizume and H. Hasegawa: Characterization of AlGaN Surfaces after Various Kinds of Surface Treatments, Technical Program with Abstracts of 42nd 2000 Electronic Materials Conference, 19-20, 2000.
  2. S. Kasai and H. Hasegawa: GaAs Singele Electron Transistors and Logic Inverters Based on Schottky Wrap Gate Structures, Conference Digest of 58th Device Research Conference, 155-156, 2000.
  3. S. Kasai, N. Negoro and H. Hasegawa: Scanning Tunneling Spectroscopy Characterization of GaAs Surfaces Passivated by MBE-Grown Ultrathin Si Layer, Technical Program with Abstracts of 42nd 2000 Electronic Materials Conference, 32-33, 2000.
  4. T. Sato, S. Kasai and H. Hasegawa: Current Transport and Capacitance-Voltage Characteristics of GaAs and InP Nanometer-Sized Schottky Contacts Formed by in situ Electrochemical Process, Program and Abstracts of 10th International Conference on Solid Films and Surfaces (ICSFS-10), MoB1520, 2000.
  5. S. Kasai, N. Negoro and H. Hasegawa: Conductance Gap Anomaly in Scanning Tunneling Spectra of MBE Grown (001) Surfaces of III-V Compound Semiconductors, Program and Abstracts of 10th International Conference on Solid Films and Surfaces (ICSFS-10), MoP103, 2000.
  6. T. Yoshida, H. Hasegawa and T. Sakai: Realization of UHV-Compatible Defect-=Free Hydrogen Terminated Silicon Surfaces with the Use of UHV Contactless Capacitance-Voltage Method, Program and Abstracts of 10th International Conference on Solid Films and Surfaces (ICSFS-10), MoB1120, 2000.
  7. T. Sato, S. Kasai and H. Hasegawa: Electrical Properties of Nanometer-Sized Schottky Contacts for Gate Control of III-V Single Electron Devices, Final Program and Collected Abstracts of the 2000 International Symposium on Formation, Physics and Device Application of Quantum Dot Structures, 20, 2000.
  8. T. Muranaka, C. Jiang, A. Ito and H. Hasegawa: Effects of Atomic Hydrogen Surface Cleaning on Selective MBE Growth of InP-based Quantum Structure Arrays, Final Program and Collected Abstracts of the 2000 International Symposium on Formation, Physics and Device Application of Quantum Dot Structures, 80, 2000.
  9. H. Hasegawa and S. Kasai: Prospects and Key Issues for Compound Semiconductor Quantum Devices Technical Report of IEICE AWAD2000 issue, 43-48, 2000.
  10. H. Hasegawa: Single Electron Devices and Circuits Based on III-V Semiconductors, Final Program and Collected Abstracts of the 2000 International Symposium on Formation, Physics and Device Application of Quantum Dot Structures, 16, 2000.
  11. S. Kasai and H. Hasegawa: GaAs Single Electron Transistors and Logic Inverters Utilizing Schottky Wrap-Gate Controlled Quantum Wires and Dots, Final Program and Collected Abstracts of the 2000 International Symposium on Formation, Physics and Device Application of Quantum Dot Structures, 24, 2000.
  12. Y. Kinoshita, T. Yamada, S. Kasai, Y. Amemiya and H. Hasegawa: Quantum-Dot Logic Systems Based on the Shared Binary-Decision Diagram, Final Program and Collected Abstracts of the 2000 International Symposium on Formation, Physics and Device Application of Quantum Dot Structures, 124, 2000.
  13. H. Fujikura, A. Hirama, F. Ishikawa, H. Sai and H. Hasegawa: Identification and Removal of Deep Levels in InGaP/GaAs Heterostructures Grown by TBP-Based, Proceedings of the 2000 International Conference on Indium Phosphide and Related Materials (IPRM2000), 372-375, 2000.
  14. H. Takahashi, M. Yamada and H. Hasegawa: Silicon Interlayer-Based Oxide-Free Surface Passivation of InP and Its Application to MISFETs, Proceedings of the 2000 International Conference on Indium Phosphide and Related Materials (IPRM2000), 485-488, 2000.
  15. H. Fujikura, A. Liu, T. Sato, T. Hirano and H. Hasegawa: Self-Assembled Formation of InP Nanopore Arrays by Electrochemical Anodization, Proceedings of the 2000 International Conference on Indium Phosphide and Related Materials (IPRM2000), 510-513, 2000.
  16. M. Iwaya, M. Yumoto. S. Kasai. and H. Hasegawa: Coupled Mode Propagation in a Novel Coupled Quantum Wire Transistor Based on Schottky In-Plane Gate Control of AlGaAs/GaAs Double Quantum Wells, Abstracts of 25th International Conference on the Physics of Semiconductors, 300, 2000.
  17. N. Negoro, S. Kasai and H. Hasegawa: Space and Energy Distribution of Surface Gap States on MBE-Grown and Silicon-Covered (001) GaAs Surfaces Studied by Scanning Tunneling Spectroscopy, Abstracts of 25th International Conference on the Physics of Semiconductors, 773, 2000.
  18. S. Kasai and H. Hasegawa: Gate Controlled Conductance Oscillations in GaAs Schottky Wrap-Gate Single Electron Transistors, Abstracts of 25th International Conference on the Physics of Semiconductors, 981, 2000.
  19. R. Nakasaki, T. Hashizume, M. Kasai, S. Ootomo and H. Hasegawa: Surface Passivation Process for GaN Based Electronic Devices Utilizing ECR-PCVD Si3N4 Film, Final Program and Abstracts of Topical Workshop on Heterostructure Microelectronics (TWHM'00), 44-45, 2000.
  20. Y. G. Xie, S. Kasai, Takahashi, C. Jiang and H. Hasegawa: Low Leakage, High Breakdown Voltage and High Transconductance Insulated Gate PHEMTs Utilizing Silicon Interface Control Layer, Final Program and Abstracts of Topical Workshop on Heterostructure Microelectronics (TWHM'00), 24-25, 2000.
  21. H. Takahashi, M. Yamada, Y.G. Xie, S. Kasai and H. Hasegawa: Completely Oxide-Free Insulated Gate Structure Having Silicon Interface Control Layer for InP MISFETs, Final Program and Abstracts of Topical Workshop on Heterostructure Microelectronics (TWHM'00), 26-27, 2000.
  22. H. Hasegawa, N. Negoro, S. Kasai and H. Fujikura: STM and STS Characterization on MBE-Grown Clean Surfaces and Ultrahin Si Covered Surfaces of GaAs, Abstracts of Symposium on Surface Physics' 2000, 11, 2000.
  23. S.Kasai, T.Sato, N.Negoro, H.Fujikura and H.Hasegawa: Control of Metal-Semiconductor Interfaces and Semiconductor Surfaces for Compound Semiconductor Quantum Devices, Proceedings of the Third SANKEN International Symposium Advanced Nanoelectronics: Devices, Materials and Computing, 257-258, 2000.
  24. H. Hasegawa: Compound Semiconductor Logic and Memory Devices Based on Novel Schottky Gate Technology, Collected Abstracts of the 2000 RCIQE International Seminar on Physics and Technology of Semiconductor Nano-Devices for the New Millennium, 490-494, 2000.
  25. T. Hashizume, S. Ootomo, R. Nakasaki, S. Oyama, J. Motohisa, H. Hasegawa and M. Kihara: Characterization of AlGaN Surfaces and AlGaN/GaN Heterointerfaces Grown by Metaloranic Vapor Phase Epitaxy, Workbook of the Tenth International Conference on Metalorganic Vapor Phase Epitaxy, 276-277, 2000.
  26. T. Hashizume, R. Nakasaki, S. Ootomo, S. Oyama and H. Hasegawa: Surface Characterization of GaN and AlGaN Layers Grown by MOVPE, Book of Abstracts of 5th International Workshop on Expert Evaluation & Control of Compound Semiconductor Materials & Technologies (EXMATEC 2000), O-070, 2000.
  27. T. Muranaka, C. Jiang, A. Ito and H. Hasegawa: Origin of Nonuniformity in MBE Growth Nanometer-Sized InGaAs Ridge Quantum Wire and Its Removal by Atomic Hydrogen-Assisted Cleaning, Final Book of Abstracts of the International Conference on Electronic Materials & European Materials Research Society Spring Meeting, F-18, 2000.
  28. H. Hasegawa: Microscopic Understanding and Control of Surfaces and Interfaces of Compound Semiconductors for Mesoscopic Devices, Book of Abstracts of US-Japan Seminar on Mesoscpic Phenomena on Surfaces (SMPS), T1, 2000.
  29. H. Hasegawa, H. Takahashi, T. Yoshida, T. Hashizume and T. Sakai: UHV-Based In-situ Characterization of Compound Semiconductor Surfaces by a Contactless Capacitance-Voltage Technique, Book of Abstracts of 5th International Workshop on Expert Evaluation & Control of Compound Semiconductor Materials & Technologies (EXMATEC 2000), O-071, 2000.
  30. H. Hasegawa: Prospects and Key Issues of Compound Semiconductor Nanoelectronics, Abstracts of 24th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe (WOCSDICE 2000), XIII3-XIII4, 2000.

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