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Research Center For Integrated Quantum Electronics, Hokkaido University
       
MBE Electronics Group
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Research Activity
Publication
Proceeding
Ed.,Writing
|1-30| |31-60| |61-86|
|1-30| |31-60| |61-90| |91-120| |121-137|
Proceeding 1-30
1999-2002
  1. H. Hasegawa, S. Oyama, M. Konishi and T. Hashizume: Anomalous Current Transport and Related Surface Traps in GaN Schottky Barriers, Extended Abstracts of the 29th Conference on the Physics and Chemistry of Semiconductor Interfaces, MO1110, 2002.
  2. H. Hasegawa: Compound Semiconductor Nano-devices and Circuits, Collected Abstract of 2002 RCIQE Seminar "Quantum Nanostructures and Their Device Applications", 19-33, 2002.
  3. H. Hasegawa, N. Negoro and Y. Nakano: Microscopic and Macroscopic Study of Surface States on Clean and Si-Deposited GaAs (001) Surfaces, Abstracts of Symposium on Surface Science 2002, 91-92, 2002.
  4. N. Negoro, S. Kasai and H. Hasegawa: Space and energy distribution of surface gap states on MBE-grown and silicon-covered (001) GaAs surfaces studied by scanning tunneling spectroscopy, 87 Springer Proceedings in Physics ICPS-25 issue, Part 1, 441-442, 2001.
  5. M. Iwaya, M. Yumoto, S. Kasai and H. Hasegawa: Coupled mode propagation in a novel coupled quantum wire transistor based on Schottky in-plane gate control of AlGaAs/GaAs double quantum wells, Springer Proceedings in Physics ICPS -25 issue, Part 1I, 1813-1814, 2001.
  6. S. Kasai and H. Hasegawa: Gated controlled conductance oscillations in GaAs Schottky wrap-gate single electron transistors, Springer Proceedings in Physics ICPS -25 issue, Part 1I, 1817-1818, 2001.
  7. T. Hashizume, S. Ootomo, S. Oyama, T. Yoshida and H. Hasegawa: Chemistry and Electrical Properties of Surfaces of GaN and AlGaN/GaN Heterostructure, Abstracts of The 28th Conference on the Physics and Chemistry of Semiconductor Interfaces (PCSI-28), We1710, 2001.
  8. S. Anantathanasarn and H. Hasegawa: Novel Surface Passivation of GaAs Using an Ultrathin Cubic GaN Interface Control Layer, Abstracts of The 28th Conference on the Physics and Chemistry of Semiconductor Interfaces (PCSI-28), MO0945, 2001.
  9. H. Hasegawa and S. Kasai: Compound Semiconductor Devices and Circuits Based on Novel Schottky Gate Technology, Collected Abstracts of 2001 RCIQE International Seminar on "Advanced Semiconductor Devices and Circuits", 50-58, 2001.
  10. S. Oyama, T. Hashizume and H. Hasegawa: Mechanism of Current Leakage through Metal/n-GaN Interfaces, Final Program and Collected Abstracts of 8th International Conference on the Formation of Semiconductor Interfaces (ICFSI-8), 280, 2001.
  11. S. Anantathanasarn and H. Hasegawa: Photoluminescence and Capacitance-Voltage Characterization of GaAs Surface Passivated by an Ultrathin GaN Interface Control Layer, Final Program and Collected Abstracts of 8th International Conference on the Formation of Semiconductor Interfaces (ICFSI-8), 180, 2001.
  12. F. Ishikawa and H. Hasegawa: Cathodoluminescence Interface Spectroscopy Characterization of InGaP/GaAs Heterointerfaces, Final Program and Collected Abstracts of 8th International Conference on the Formation of Semiconductor Interfaces (ICFSI-8), 160, 2001.
  13. A. Ito, T. Muranaka, C. Jiang and H. Hasegawa: Formation of High-Density Honeycomb Networks of InGaAs Ridge Quantum Wires by Atomic Hydrogen Assisted Selective MBE, Final Program and Collected Abstracts of 8th International Conference on the Formation of Semiconductor Interfaces (ICFSI-8), 98, 2001.
  14. M. Yumoto, S. Kasai and H. Hasegawa: Gate Control Properties of Nanometer-Scale Schottky Wrap Gates for GaAs-based Quantum Structures, Final Program and Collected Abstracts of 8th International Conference on the Formation of Semiconductor Interfaces (ICFSI-8), 106, 2001.
  15. N. Negoro, S. Kasai and H. Hasegawa: Microscopic Study of Surface States on Clean and Si-deposited GaAs (001) Surfaces by Bias-dependent STM Topology and STS Spectra, Final Program and Collected Abstracts of 8th International Conference on the Formation of Semiconductor Interfaces (ICFSI-8), 154, 2001.
  16. Z. Fu, S. Kasai and H. Hasegawa: Gated Photoluminescence Study of Oxide-Free InP MIS Structure Having an Ultrathin Silicon Interface Control Layer, Final Program and Collected Abstracts of 8th International Conference on the Formation of Semiconductor Interfaces (ICFSI-8), 216, 2001.
  17. S. Kasai and H. Hasegawa: III-V Quantum Devices and Circuits Based on Nano-scale Schottky Gate Control of Hexagonal Quantum Wire Networks, Final Program and Collected Abstracts of 8th International Conference on the Formation of Semiconductor Interfaces (ICFSI-8), 8, 2001.
  18. Z. Jin, T. Hashizume and H. Hasegawa: Effects of Nitrogen Addition on Methane-Based ECR Plasma Etching of GaN and Related Materials, Final Program and Collected Abstracts of 8th International Conference on the Formation of Semiconductor Interfaces (ICFSI-8), 278, 2001.
  19. N. Sakaguchi, M. B. Takeyama, A. Noya, T. Hashizume and H. Hasegawa: Characterization of Cu-Hf Alloy Electrode for Realization of Ohmic Contact to n-InP with Low Contact Resistance, Final Program and Collected Abstracts of 8th International Conference on the Formation of Semiconductor Interfaces (ICFSI-8), 242, 2001.
  20. M. Endo, Z. Jin, S. Kasai and H. Hasegawa: Reactive Ion Beam Etching of GaN and AlGaN for Nanostructure Fabrication Using Methane-Based Gas Mixtures, Extended Abstracts of the 2001 International Conference on Solid State Devices and Materials, 320-321, 2001.
  21. Y. Nakano, N. Negoro and H. Hasegawa: Strong Photoluminescence and Low Surface State Densities on Clean and Silicon Deposited (001) Surfaces of GaAs with (4x6) Reconstruction, Extended Abstracts of the 2001 International Conference on Solid State Devices and Materials, 366-367, 2001.
  22. M. Yumoto, S. Kasai and H. Hasegawa: A Novel GaAs Binary Decision Diagram Device Having Quantum Wire Branch-Switches Controlled by Wrap Gates, Extended Abstracts of the 2001 International Conference on Solid State Devices and Materials, 304-305, 2001.
  23. C. Jiang, T. Muranaka and H. Hasegawa: Structural and Optical Properties of 10 nm-Class InGaAs Ridge Quantum Wire Arrays with Sub-Micron Pitches Grown by Selective MBE on Patterned Substrate, Extended Abstracts of the 2001 International Conference on Solid State Devices and Materials, 318-319, 2001.
  24. F. Ishikawa and H. Hasegawa: Non-destructive Characterization of Heterointerfaces by Depth-Resolved Cathodoluminescence and its Application to InGaP/GaAs interface, Proceedings of the 2001 International Conference on Indium Phosphide and Related Materials (IPRM2001), 537-540, 2001.
  25. A.Ito, T. Muranaka, S. Kasai and H. Hasegawa: Atomic Hydrogen Assisted Selective MBE Growth of InGaAs Ridge Quantum Wire Honeycomb Network Structures for Binary-Decision Diagram Quantum LSIs, Proceedings of the 2001 International Conference on Indium Phosphide and Related Materials (IPRM2001), 521-524, 2001.
  26. Z. Fu, H. Takahashi, S. Kasai and H. Hasegawa: Optimization of Novel Oxide-Free Insulated Gate Structure for InP Having An Ultrathin Silicon Interface Control Layer, Proceedings of the 2001 International Conference on Indium Phosphide and Related Materials (IPRM2001), 413-416, 2001.
  27. T. Hirano, A. Ito, T. Sato, F. Ishikawa and H. Hasegawa: Electrochemical Formation of Self-Assembled Nanopore Arrays As Templates for MBE Growth of InP-based Quantum Wires and Dots, Proceedings of the 2001 International Conference on Indium Phosphide and Related Materials (IPRM2001), 378-381, 2001.
  28. C. Jiang, T. Muranaka and H. Hasegawa: Realization of Submicron-Pitch Linear Arrays of Nanometer-Sized InGaAs Ridge Quantum Wires by Selective MBE Growth on Patterned InP Substrates, Proceedings of the 2001 International Conference on Indium Phosphide and Related Materials (IPRM2001), 374-377, 2001.
  29. R. Atsuchi, M. B. Takeyama, A. Noya, T. Hashizume and H. Hasegawa: Formation and Characterization of AlxMo1-x/n-InP Alloy Electrode System for Realization of Thermally Stable Ohmic Contacts, Proceedings of the 2001 International Conference on Indium Phosphide and Related Materials (IPRM2001), 264-267, 2001.
  30. F. Ishikawa and H. Hasegawa: Contactless Characterization of Multi-Epitaxial Wafer by Depth-Resolved Cathodoluminescence, Technical Program with Abstracts of 2001 Electronics Materials Conference (EMC2001), 50-51, 2001.

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